PRACTICAL ELECTRON MICROSCOPY OF LATTICE DEFECTS

PRACTICAL ELECTRON MICROSCOPY OF LATTICE DEFECTS

HIROYASU SAKA

132,54 €
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Editorial:
World Scientific Publishing Co Pte Ltd
Año de edición:
2021
ISBN:
9789811234699
132,54 €
IVA incluido
Disponible
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This unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided.

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